(Thursday, October 22, 2015) – As a yearly event of great significance to students’ academic performance and productivity, the “Plagiarism and Referencing Styles” workshop was successfully facilitated by Ms. Dao Nguyen Anh Duc, one of IEI’s dedicated and experienced faculty members at Nguyen Van Thu Campus, District 1, Ho Chi Minh City.
The workshop was actively attended by dozens of undergraduate and graduate students in the evening of October 22nd, 2015.
With her first-hand experience and specialist knowledge of the topic, Ms. Dao Nguyen Anh Duc made an impressive start by giving participating students a brief introduction of Harvard Referencing Style Guide, which has primarily been used by university students to cite information sources such as in-text citations and reference lists.
A wide range of practical examples were appropriately added in the workshop for the purpose of creating a truly pleasant and stimulating atmosphere for every participant students.
In addition, Ms. Dao Nguyen Anh Duc familiarized all students with the term “plagiarism” which could probably be the workshop‘s cornerstone. Dealing with this crucial element, students gained useful insights into avoiding possible plagiarism errors by analyzing a series of group assignments that were of great help to their academic writing process at IEI.
Gaining familiarity with these rules, however, was critically important, as inadvertent mistakes could lead to charges of plagiarism, which was the uncredited use (both intentional and unintentional) of somebody else's words or ideas.
Last but not least, Ms. Dao Nguyen Anh Duc introduced students to “Turnitin”, an internet-based plagiarism-prevention service as well as instructed them on how to submit their essays to the Turnitin website, which would check the documents for unoriginal content.
At the end of the workshop, participating students had a group photo taken with Ms. Dao Nguyen Anh Duc, who helped them approach better methods for their upcoming assignments and projects. Thank you so much for joining us and hope to see you again in the forthcoming events of IEI.